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CVE-2018-21063
An issue was discovered on Samsung mobile devices with M(6.0), N(7.x), and O(8.x) (Exynos chipsets) software. Keymaster has an…
- 9.8CriticalCVSS base score
- 0.56%Exploitation in 30 daysEPSS · top 53% of all CVEs
- NoKnown exploitednot in CISA's KEV catalog
- NonePublic exploitsnone known yet
Description
An issue was discovered on Samsung mobile devices with M(6.0), N(7.x), and O(8.x) (Exynos chipsets) software. Keymaster has an architectural problem because tlApi in TEE is not properly protected. The Samsung ID is SVE-2018-11792 (August 2018).
Timeline
ID reserved
By mitre
- 1 day later
· 1 day later
Published
- 4 years later
· 4 years later
Record updated
Changes after publication (a new score, a public exploit, EPSS crossing 1, 10 or 50 %, leaving KEV) are kept since November 2026; earlier ones are not known.
Scores
| Scored by | CVSS | Score | Vector |
|---|---|---|---|
| NVDNVD · Modified | 3.1 | Critical9.8 | CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H |
- EPSS (exploitation in 30 days)
- 0.56% · top 53% of all CVEs (9 Nov 2026)
Loading the EPSS history…
The list uses the assigner's score when there is one, then CISA's, then NVD's: Critical 9.8.
Affected products
n/a
- affected n/a
References
1
- https://security.samsungmobile.com/securityUpdate.smsb (opens in a new tab)x_refsource_CONFIRMx_transferred
Sources
The same CVE in the primary databases and aggregators, to check against.
- CVE.org record (opens in a new tab)
- CVE List JSON (GitHub) (opens in a new tab)
- NVD (opens in a new tab)
- FIRST EPSS (opens in a new tab)
- EUVD EUVD-2018-13581 (opens in a new tab)
- OSV.dev (opens in a new tab)
- GitHub Advisories (opens in a new tab)
- CIRCL Vulnerability-Lookup (opens in a new tab)
Badge for a README or a ticket
[](https://cveledger.app/cve/CVE-2018-21063)Record last updated .