CVE-2019-20607
An issue was discovered on Samsung mobile devices with N(7.x), O(8.x), and P(9.0) (MSM8996, MSM8998, Exynos7420, Exynos7870, Exynos8890,…
- 9.8CriticalCVSS base score
- 0.88%Exploitation in 30 daysEPSS · top 40% of all CVEs
- NoKnown exploitednot in CISA's KEV catalog
- NonePublic exploitsnone known yet
Description
An issue was discovered on Samsung mobile devices with N(7.x), O(8.x), and P(9.0) (MSM8996, MSM8998, Exynos7420, Exynos7870, Exynos8890, and Exynos8895 chipsets) software. A heap overflow in the keymaster Trustlet allows attackers to write to TEE memory, and achieve arbitrary code execution. The Samsung ID is SVE-2019-14126 (May 2019).
Timeline
ID reserved
By mitre
- 1 day later
· 1 day later
Published
- 4 years later
· 4 years later
Record updated
Changes after publication (a new score, a public exploit, EPSS crossing 1, 10 or 50 %, leaving KEV) are kept since November 2026; earlier ones are not known.
Scores
| Scored by | CVSS | Score | Vector |
|---|---|---|---|
| NVDNVD · Modified | 3.1 | Critical9.8 | CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H |
- EPSS (exploitation in 30 days)
- 0.88% · top 40% of all CVEs (12 Nov 2026)
The list uses the assigner's score when there is one, then CISA's, then NVD's: Critical 9.8.
Affected products
n/a
- affected n/a
References
References1
- https://security.samsungmobile.com/securityUpdate.smsb (opens in a new tab)x_refsource_CONFIRMx_transferred
Sources
The same CVE in the primary databases and aggregators, to check against.
- CVE.org record (opens in a new tab)
- CVE List JSON (GitHub) (opens in a new tab)
- NVD (opens in a new tab)
- FIRST EPSS (opens in a new tab)
- EUVD EUVD-2019-11147 (opens in a new tab)
- OSV.dev (opens in a new tab)
- GitHub Advisories (opens in a new tab)
- CIRCL Vulnerability-Lookup (opens in a new tab)
Badge for a README or a ticket
[](https://cveledger.app/cve/CVE-2019-20607)Record last updated .